This document presents a new block cleaning scheme for flash memory called the Greedy and Frequency-Based (GR-FB) scheme, designed to minimize cleaning costs and improve memory block lifespan. The scheme integrates victim block selection with valid data re-organization processes, resulting in reduced cleaning costs by at least 8% compared to existing methods. Simulation results demonstrate that the GR-FB scheme not only enhances cleaning process efficiency but also balances wear across memory blocks effectively.